Join us at UKIVA’s Machine Vision Conference 2020 to hear John Dunlop talking about Artificial Intelligence in Thermal Imaging.

The presentation considers the application of machine learning and artificial intelligence in the rapidly growing field of thermal imaging.  Thermal cameras are rapidly becoming an essential tool in the packaging sector – to identify quality issues during sealing and carton closure, but many of these processes cannot be easily defined in a programmatic sense.  The processes do not have a clear manufacturing tolerances defining pass or fail criteria and are affected by variations like environment or poor fixturing. Inspections are better defined by learning by examining the characteristics of passed and failed examples, as with machine learning.  This presentation considers some real cases and how artificial intelligence can be used to improve inspection performance.

See the highlights from our time at last year’s UKIVA Machine Vision Conference below.

Click here to register

We hope to see you there!